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Multiport S-Parameters Measurement for 3D-MIMO

Device:Test Instrument

Vendor: Rohde & Schwarz


The R&S® ZVBT can measure up to 24 simultaneous ports and can be further extended to 288 ports using a 2x24 R&S® ZN-Z84 switch matrix. This allows significantly faster measurements of 3D-MIMO antenna arrays compared to a more traditional 4-port VNA. Other highlights include a wide dynamic range, high output power levels, and inputs featuring high power-handling. The instrument operates in a frequency range from 9 kHz to 8.5 GHz. These features make the R&S®ZNBT8 ideal for applications in the mobile radio, wireless communications and electronic goods industries. The R&S®ZNBT8 offers superior performance over switch matrices. Its high integration density provides a very compact solution for analyzing components for up to 24 ports – occupying the same rack space as an R&S®ZNB. The convenient user interface makes it easy to handle even very complex multiport measurements. The R&S®ZNBT8 supports various remote control options and is easy to integrate into automated test systems.


Features & Benefits:

Platform for challenging multiport measurements
• True multiport network analyzer
• Multiport measurements made easy
• Measurements at high power levels

When speed counts
• Short test times with a large number of ports
• Data transfer simultaneously with sweep
• Fast switchover between instrument setups
• Test sequence control via TTL signals
• Simultaneous testing of multiple DUTs
• Segmented sweep for optimized speed and accuracy

Excellent measurement characteristics
• Fast and accurate
• High long-term stability for long calibration intervals
• Calibration methods for every application
• Calibration units speed up multiport calibrations

Complex analysis of active and passive components
• More than 100 traces and channels for characterizing complex components
• Wide range of virtual matching networks for realtime embedding/deembedding
• Frequency-converting measurements on amplifiers and mixers
• Simple and fast characterization of balanced DUTs
• Time domain analysis with gating function
• Voltage and current measurements
• Measurements on frontend modules (FEMs)